Technical Specification |
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Make |
Nanonics Imaging Limited, Israel |
Model |
Multview 2000 |
Focal Length |
250mm |
Raman Spectrum |
50cm-1 to 4000cm-1 |
Description |
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Microscope: Specially adapted Research Grade Leica microscope allowing confocal measurements with better than 2.5μm depth resolution (using a 100x objective), 2.5x, 20x and 50x objective. Laser: Air cooled Argon Ion Laser , 50Mw at 514nm, High power Infrared diode laser 250Mw at 785nm, Auto align and optimisation of input laser power Detector: CCD array detector near infrared enhanced, deep resolution (576x384 pixels). Peltier cooler to -70˚C
AFM & Raman Atomic Force Microscopy (AFM) provides a variety of nanometric characterizations such as topography, conductivity, and thermal measurements. While very effective at measuring certain properties, AFM cannot identify the chemical composition of a given material. Raman spectroscopy, however, has emerged as a critical technique in the field of chemical characterization, accurately identifying and classifying materials in a number of diverse fields and industries such as: material science, chemistry, biophysics, semiconductors, and many more. |
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Sample nature & Sample requirement |
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Sample Nature : Solid |
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