CSIR-Central Electrochemical Research Institute
(A premier R&D Institute in Electrochemistry)
Central Instrumentation Facility

Material characterization and instrumental methods of Analysis form an indispensable tool for any R and D program. The Central Instrumentation Facility (CIF) is been established at the Central Electrochemical Research Institute, Karaikudi that acquires, maintains sophisticated analytical equipments all under one roof and provides service to the R & D projects of CECRI, Research scholars, academic institutions and industries. The facility has grown into an important R & D-support group for spectral measurements, structure determination and materials characterization.

CIF has the following sophisticated analytical instrumentation facilities to characterize bulk materials and surfaces using Spectroscopy, Resonance, Surface analytical, X-ray, Thermal and Chromatographic techniques.

 

Guidelines for Sample Submission and Analysis Charges for Instrumentation Facilities

  

Analytical Facilities:

S. No. Facility Name  Technical Details Requisition Form
1  FT-IR Spectrometer  Download Download
2 Micro Hardness Tester  Download Download
3 UV-VIS-NIR Double Beam Spectrophotometer  Download Download
4 Fluorescence Spectrophotometer  Download Download
5 Laser Raman Microscope  Download Download
6 Tip Enhanced Raman Spectroscopy (TERS)  Download Download
7 SCANNING PROBE MICROSCOPY (SPM)  Download Download
8 Nuclear Magnetic resonance (NMR)  Download Download
9 Scanning Electron Microscope  Download Download
10

XRD (Bruker)

Download Download
11 XRD (PAN Analytical)  Download  Download
12 XRD (RIGAKU) LOW ANGLE XRD  Download Download
13 Transmission Electron Microscope - TEM  Download Download
14 Electron Paramagnetic Resonance (EPR) Spectrometer  Download Download
15 High Resolution SEM (FESEM)  Download Download
16 Gas Chromatography - Mass Spectrometer  Download Download
17 High-performance liquid chromatography (HPLC)  Download  Download
18 Particle Size Analyser  Download  Download
19  High Resolution - Transmission Electron Microscope (HR-TEM)  Download Download

20

CHNS Analysis  Download  Download
21 AAS Analysis  Download  Download
22  TGA/DSC Analysis  Download  Download
 23 TGA/DTA/DSC  Download  Download
 24  XPS/XPS [ESCA]  Download  Download
 25  XRF  Download  Download
       

Services:

  • Analysis of samples for academic institutions and industries: These analytical facilities are being extended to other academic institutions and industries on payment basis. The technical details, charges and necessary requisition forms are available in the above table.

  • Training: On specific request CIF conducts training programmes on “Instrumental Methods of Analysis” for the benefit of R & D personnel, teaching faculties in colleges and engineers employed in industries.

  • Project guidance is offered for M.Sc and M.E / M.Tech students in their final year projects.

  • Refresher course on “Instrumental methods of analysis” for academicians and industries. Scope of the course: Chemical and physical property analysis of bulk and Surfaces, to facilitate reinforcing basic understanding of the theory and practice of analysis. Lab visit is included.

  • Certificate course: Skill development in the operation & maintenance of sophisticated Analytical instruments. This program helps to gain exposure in the operation and maintenance of analytical instruments like x-ray techniques, imaging techniques, spectroscopic techniques and thermal techniques. It is targeted towards educated youth seeking career in industrial sector.

  • Tailor made Program: Depending on the type of industry a combination of analytical techniques will be covered for solving specific problems of analysis faced by industries.

Contact Persons:


Dr. S. Radhakrishnan
Senior Principal Scientist
Central Instrumentation Facility
Phone : 04565 241466
sradhakrishnan[at]cecri.res.in