Central Electrochemical Research Institute

Central Instrument Facility

XRD Facility

Make :

PANalytical
Model : X’per PRO
Source : Cu K( 2.2 KW Max.)
Detector : X’celerator( Semiconductor)
Beta Filter :

Ni foil (incident beam side)
Graphite crystal( diffracted beam side)
Attachments Sample holder: Sample spinner and zero background sample holder

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Thermal Analyser (TGA-DSC-DTA)

TA Instruments Model SDT Q600
(http://www.tainstruments.com/product.aspx?id=22&n=1&siteid=11)

Simultaneous TG (Thermogravimetry), DSC (Differential Scanning Calorimetry) and DTA (Differential Thermal Analysis)

Maximum Temperature : 1500oC
Maximum heating rate : 100oC/minute upto 1000oC & 25oC/minute above 1000oC
Heating rate programmable (upto 10 different heating rates possible in one analysis)
Atmosphere : Air, Nitrogen
Data can be collected while cooling also
Sample : Solids
Software : Thermal Advantage

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Gel permeation liquid chromatograph
SHIMADZU

For analysis of polymer composites and molecular weight determination

Mobile Phase : Water, THF(Tetrahydrofurane)
Column : CLC-Polystyrene
Pump : LC-6A
Injection per sample : 20 µl
Detector : RI (Refractive Index)
Sample : Solid, Liquids (polymer compounds)
Software : Spinchrome CFR Single Channel

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High-performance liquid chromatograph

To analyse various components in organic mixtures

Stationary Phase : Silica gel
Mobile Phase : Methanol, methanol-water, acetonitrile, acetonitrile-water
Column : CLC-ODS-C18
Pump : LC-8A
Injection per sample : 20 µl
Detector : UV Spectrophotometric
Sample : Solids, Liquids
Software : Spinchrome CFR Single Channel

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FTIR Raman Microscope

Make: Thermo Electron Corporation, USA
Model: Nexus 670 (FTIR), Centaurms 10X (Microscope)
Detector: DTGS(KBr window) (deuterated triglycine sulfate)
Spectral Range 11,000 to 375 cm-1
Beam splitter - XT-KBr
Attenuated Total Reflectance (Smart Multi bounce - HATR) accessory for rapid quantitative/qualitative analysis and sample preparation is usually not needed
FT-85o grazing angle accessory for thin film / monolayer analysis
Specular reflectance accessory for nondestructive method of measuring surface coatings without sample preparation – cane be used to analyse surface treated metals, paints, semiconductors, and resin and polymer coatings
Microscope for FTIR
FT-RAMAN
10 x centaurus continuum microscope

For fast non-destructive microanalysis with minimum amount samples

Spectra of transmission, reflection and ATR samples, with continuous viewing of the sample during collection

MCT-B detector

Spectral Range 11,000 to 400 cm-1

Signal to Noise ratio < 0.10

 InGaAs (Indium-Gallium Arsenide) detector

Excitation Laser Nd:YAG source (neodymium-doped Yttrium aluminium garnet)

Laser wavelength 1064 nm (9398 cm-1) & Power max. 1.5 watts

Spectral range
3600-100 cm-1 Stokes lines
2200-200 cm-1 anti-stokes lines

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Scanning Probe Microscope

AFM/STM
Model : Picoscan 2000
Make : Molecular Imaging
Multiple imaging – one scanners for both AFM/STM
STM Scanners – Scan size
 Size
 Lateral
 Vertical
 Atomic
 1 µm
 0.7 µm
 Small
 10 µm
 1.6 µm
 Medium
 50 µm
 7 µm
STM Scanners – Scan size
Size
Lateral
Vertical
Atomic
1 µm
0.7 µm
Small
6 µm
2 µm
Medium
30 µm
7 µm
Operation Modes
Features
STM – Current mode or height mode imaging

EC-STM – Current and height image

AFM – Contact and Lateral force AFM

EC-AFM – Contact and AC AFM image

SpCurrent sensing AFM (CSAFM) – Maps local conductivity along with topography, I/V spectroscopy at constant force, constant potential measurement, simultaneously probing conductivity and topography

Acoustic AC mode (AAC) – Acoustic wave driven, intermittent contact AFM, operates at resonant frequency 5 – 500 kHz

 Easy fluid imaging

 Environmental control – Humidity & chemical vapor

 Temperature control – Resistive heating stage allows ambient to over 270oC

 Electrochemical control for EC-STM/AFM
   * Potential / Current control
   * 10 mA – 30 mA current range, 10 nA sensitivity
   * 10 V potential range with 0.3 mV resolution

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Advanced Ion Chromatograph

Modular anion or cation system with electronic suppressor
Supplier: M/s Metrohm AG, Switzerland
Typical ions that could be determined:
Anions:
Chromate, vanadate, tungstate, molybdate, phosphate, nitrate, fluoride, chloride, bromide, iodide, hydroxide, selenate, sulphate, antimonite
Cations:
Lithium, sodium, Potassium, Magnesium, Calcium, Strontium, Barium, Manganese, Iron, Cobalt, Nickel, Copper, Zinc, Silver, Cadmium, Aluminium, Ammonium, Lead, Cyanide, additives of plating industries

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Scanning Electron Microscope

HITACHI Model S-3000H (for more details visit: www.hhtc.ca/microscopes/sem/s3000nh.htm)

Maximum magnification : 300,000 x
Resolution : 3.5 nm
Image display : Secondary electron image
Automatic functions : Auto brightness & contrast, Auto focus and stigmatism, Auto gun alignment, Auto start
Samples : Solid samples (pellets, powders, thin films, metallic samples)

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Laser Raman Spectrometer

Renishaw InVia Laser Raman Microscope

Laser Wavelength :

633 nm He-Ne laser
Laser Power : 18 mW
Power can be adjusted from 0.00005 % to 100 %
Wavelength Scan range : 100 – 3300 cm-1

Detector:

CCD type
Localized and extended scans possible

Samples : Solid, thin film and crystals can be studied

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Differential Scanning Calorimeter (DSC)

TA Instruments Model DSC 2010

Maximum Temperature : 600oC
725oC (under inert atmosphere)
Maximum heating rate : 100oC per minute (programmable)
Atmosphere : Air / Nitrogen
Sample : Liquids and Solids

Sample Size :

0.5 to 100 mg
Software : Thermal Solutions and Universal Analysis

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Atomic Absorption Spectrophotometer

VARIAN Model SPECTRAA 220
(for more details visit: www.varianinc.com/cgi-bin/nav?products/spectr/aa/index&cid=ILQJNIJHFM)

Flame : Acetylene – Air , Acetylene – N2O
GTA (Graphite Tube Atomizer) : For ppb level analysis
Elements detectable : Almost all metallic elements
Sample : Liquids and solids (dissolved clear homogeneous solution preferred)

Software :

SpectrAA software

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CHNS Elemental Analyser

elementar Model Vario EL III
(http://www.elementar.de/cms/vario_el_info.html)
elementar Model Vario EL III
Determines C,H,N,S content in solids and liquids
Lower detection limit : 0.1µg (N), 0.5µg (CHS)
Accuracy : 0.05%
Analysis time : 10 to 14 minutes
Carrier gas : Helium
Software : WinVar

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Scanning Vibrating Probe(SVP) & Scanning Kelvin Probe(SKP) systems

Make: Uniscan Instruments Limited, U K

Applications of SVP

• Pitting corrosion
• Pit development
• Evaluation of surface coatings
• Stress corrosion
• Corrosion under flow

Applications of SKP

• Surface Inhomogenities
• Contamination
• Corrosion
• Oxidation
• Coating continuity

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